Kun-Han Tsai
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
31
Venues
8
Active years
1997–2025
Best venue rank
A*
Where they publish
Papers
31 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | VTS | Timing-Verification Test Generation Targeting Small Delay Defects. | Jiezhong Wu, Nilanjan Mukherjee, Irith Pomeranz, Kun-Han Tsai, Janusz Rajski |
| 2021 | VTS | Timing Critical Path Validation for Intel ATOM Cores Using Structural Test. | Wei Li, Shih-Yu Yang, Khen Wee, Ricardo Sanchez, Jay Desai, Kun-Han Tsai, Xijiang Lin |
| 2020 | ITC | Test Challenges of Intel IA Cores. | Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin |
| 2016 | ETS | Testing of small delay faults in a clock network. | Shaofu Yang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2016 | ITC | Online slack-time binning for IO-registered die-to-die interconnects. | Chih-Chieh Zheng, Shi-Yu Huang, Shyue-Kung Lu, Ting-Chi Wang, Kun-Han Tsai, Wu-Tung Cheng |
| 2015 | ITC | Monitoring the delay of long interconnects via distributed TDC. | Meng-Ting Tsai, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2014 | ETS | On-the-fly timing-aware built-in self-repair for high-speed interposer wires in 2.5-D ICs. | Shi-Yu Huang, Zeng-Fu Zeng, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | IOLTS | At-speed BIST for interposer wires supporting on-the-spot diagnosis. | Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | ITC | Delay testing and characterization of post-bond interposer wires in 2.5-D ICs. | Shi-Yu Huang, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | ITC | Design rule check on the clock gating logic for testability and beyond. | Kun-Han Tsai, Shuo Sheng |
| 2012 | DAC | Small delay testing for TSVs in 3-D ICs. | Shi-Yu Huang, Yu-Hsiang Lin, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter, Yung-Fa Chou, Ding-Ming Kwai |
| 2012 | ITC | A unified method for parametric fault characterization of post-bond TSVs. | Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter |
| 2010 | ASPDAC | Improved weight assignment for logic switching activity during at-speed test pattern generation. | Meng-Fan Wu, Hsin-Cheih Pan, Teng-Han Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2010 | ETS | Scan based speed-path debug for a microprocessor. | Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz |
| 2010 | ICCAD | A scalable quantitative measure of IR-drop effects for scan pattern generation. | Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli |
| 2010 | ITC | Test cycle power optimization for scan-based designs. | Kun-Han Tsai, Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli |
| 2009 | ETS | Speed-Path Debug Using At-Speed Scan Test Patterns. | Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
| 2007 | DAC | Test Generation in the Presence of Timing Exceptions and Constraints. | Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Janusz Rajski |
| 2007 | ITC | Enhanced testing of clock faults. | Teresa L. McLaurin, Rich Slobodnik, Kun-Han Tsai, Ana Keim |
| 2006 | ITC | Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. | Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
| 2006 | ITC | Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. | Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich |
| 2006 | VTS | Improved Handling of False and Multicycle Paths in ATPG. | Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami |
| 2005 | ITC | Built-in constraint resolution. | Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai |
| 2004 | ICCD | Diagnosis of Hold Time Defects. | Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
| 2004 | ITC | Realizing High Test Quality Goals with Smart Test Resource Usage. | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2003 | ICCD | Multiple Fault Diagnosis Using n-Detection Tests. | Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | An Efficient and Effective Methodology on the Multiple Fault Diagnosis. | Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |
| 2002 | ITC | Embedded Deterministic Test for Low-Cost Manufacturing Test. | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian |
| 1997 | DAC | STARBIST: Scan Autocorrelated Random Pattern Generation. | Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska |
| 1997 | ITC | Scan-Encoded Test Pattern Generation for BIST. | Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |