| 2024 | ISCAS | Utilization of Noise-Shaping in Mixed-Signal Timing-Skew Mismatch Calibration of TI-ADCs. | Hamidreza Mafi, Mohamed Amine Bensenouci, Sadok Aouini, Mohammad Honarparvar, Naim Ben-Hamida, Yvon Savaria |
| 2020 | DATE | Study on the Compensation of Silicon Photonics-Based Modulators in DCI Applications. | Naim Ben-Hamida, Ahmad Abdo, Xueyang Li, Md Samiul Alam, Mahdi Parvizi, Claude D'Amours, David V. Plant |
| 2020 | ISNCC | Seizure Prediction with a Single iEEG Electrode Using Non-linear Techniques. | Tahar Haddad, Naim Ben-Hamida, Sadok Aouini, Jihene Rezgui |
| 2018 | ISCAS | New Charge-Steering Latches in 28nm CMOS for Use in High-Speed Wireline Transceivers. | Jacob Pike, Mahdi Parvizi, Naim Ben-Hamida, Sadok Aouini, Calvin Plett |
| 2018 | VTS | A coherent subsampling test system arrangement suitable for phase domain measurements. | Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida |
| 2000 | DAC | Closing the gap between analog and digital. | Khaled Saab, Naim Ben-Hamida, Bozena Kaminska |
| 2000 | DATE | Parametric Fault Simulation and Test Vector Generation. | Khaled Saab, Naim Ben-Hamida, Bozena Kaminska |
| 1996 | ICCD | Testing of embedded A/D converters in mixed-signal circuit. | Naim Ben-Hamida, Bechir Ayari, Bozena Kaminska |
| 1996 | ITC | LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. | Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel |
| 1995 | DATE | Automatic test vector generation for mixed-signal circuits. | Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska |
| 1994 | ISCAS | High Level Synthesis with Testability Constraints. | Naim Ben-Hamida, Bozena Kaminska |
| 1994 | ISCAS | Pseudo-Random Vector Compaction for Sequential Testability. | Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria |
| 1994 | VLSID | Multiple Fault Testing in Analog Circuits. | Naim Ben-Hamida, Bozena Kaminska |
| 1993 | ISCAS | Initiability: A Measure of Sequential Testability. | Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria |
| 1993 | ITC | Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. | Naim Ben-Hamida, Bozena Kaminska |