| 2015 | ITC | A comparative study of one-shot statistical calibration methods for analog / RF ICs. | Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris |
| 2013 | DATE | Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | ETS | On combining alternate test with spatial correlation modeling in analog/RF ICs. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | ITC | Process monitoring through wafer-level spatial variation decomposition. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2012 | ICCAD | Spatial correlation modeling for probe test cost reduction in RF devices. | Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris |
| 2012 | ITC | Spatial estimation of wafer measurement parameters using Gaussian process models. | Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris |
| 2012 | ITC | Integrated optimization of semiconductor manufacturing: A machine learning approach. | Nathan Kupp, Yiorgos Makris |
| 2012 | VTS | Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier. | Dzmitry Maliuk, Nathan Kupp, Yiorgos Makris |
| 2011 | DATE | Correlating inline data with final test outcomes in analog/RF devices. | Nathan Kupp, Mustapha Slamani, Yiorgos Makris |
| 2011 | ICCAD | On proving the efficiency of alternative RF tests. | Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris |
| 2010 | ITC | Post-production performance calibration in analog/RF devices. | Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris |
| 2008 | ETS | Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. | Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris |