| 1999 | VTS | Test Metrics for Analog Parametric Faults. | Stephen K. Sunter, Naveena Nagi |
| 1998 | VTS | Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. | Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi |
| 1997 | ITC | A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. | Stephen K. Sunter, Naveena Nagi |
| 1997 | VLSID | Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. | Abhijit Chatterjee, Naveena Nagi |
| 1997 | VTS | Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. | Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi |
| 1996 | VLSID | Low-cost DC built-in self-test of linear analog circuits using checksums. | Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi |
| 1995 | VLSID | Efficient multisine testing of analog circuits. | Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham |
| 1994 | ICCD | A Signature Analyzer for Analog and Mixed-signal Circuits. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1993 | DAC | DRAFTS: Discretized Analog Circuit Fault Simulator. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1993 | ICCAD | Fault-based automatic test generator for linear analog circuits. | Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham |
| 1993 | ICCD | MIXER: Mixed-Signal Fault Simulator. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1992 | VTS | Hierarchical fault modeling for analog and mixed-signal circuits. | Naveena Nagi, Jacob A. Abraham |
| 1992 | VTS | Delay fault testing of iterative arithmetic arrays. | Rabindra K. Roy, Naveena Nagi, Abhijit Chatterjee, Manuel A. d'Abreu |