Nektar Xama
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
11
Venues
5
Active years
2017–2023
Best venue rank
B
Where they publish
Papers
11 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | ETS | High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. | Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2020 | ETS | Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. | Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | ETS | Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. | Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen |
| 2020 | ITC | Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. | Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | VTS | Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. | Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2019 | DATE | Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs. | Georges G. E. Gielen, Nektar Xama, Karthik Ganesan, Subhasish Mitra |
| 2019 | ITC | Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. | Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2018 | ISCAS | Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. | Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama |
| 2017 | ETS | A very low cost and highly parallel DfT method for analog and mixed-signal circuits. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ETS | Automatic testing of analog ICs for latent defects using topology modification. | Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ITC | Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |