| 2020 | ITC | Learning A Wafer Feature With One Training Sample. | Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa |
| 2019 | ITC | Deploying A Machine Learning Solution As A Surrogate. | Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa |
| 2019 | VTS | Wafer Pattern Recognition Using Tucker Decomposition. | Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa |
| 2018 | ITC | Concept Recognition in Production Yield Data Analytics. | Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
| 2017 | ITC | Kernel based clustering for quality improvement and excursion detection. | Nik Sumikawa, Matt Nero, Li-C. Wang |
| 2017 | VTS | Learning the process for correlation analysis. | Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg |
| 2015 | IOLTS | Reliability/yield trade-off in mitigating "no trouble found" field returns. | Amr Haggag, Nik Sumikawa, Aamer Shaukat |
| 2014 | IOLTS | Multivariate outlier modeling for capturing customer returns - How simple it can be. | Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2014 | ITC | Yield optimization using advanced statistical correlation methods. | Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2013 | ITC | A pattern mining framework for inter-wafer abnormality analysis. | Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2012 | ICCAD | Novel test detection to improve simulation efficiency - A commercial experiment. | Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir |
| 2012 | ITC | Functional test content optimization for peak-power validation - An experimental study. | Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang |
| 2012 | ITC | Screening customer returns with multivariate test analysis. | Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2012 | ITC | An experiment of burn-in time reduction based on parametric test analysis. | Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2011 | DATE | Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. | Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir |
| 2011 | ITC | Forward prediction based on wafer sort data - A case study. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | VTS | Understanding customer returns from a test perspective. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |