| 2009 | DDECS | An on-line testing scheme for repairing purposes in Flash memories. | Olivier Ginez, Jean-Michel Portal, Hassen Aziza |
| 2009 | ETS | Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. | Olivier Ginez, Jean-Michel Portal, Christophe Muller |
| 2008 | ITC | A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. | Olivier Ginez, Jean-Michel Portal, Hassen Aziza |
| 2007 | ETS | Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. | Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | ITC | A concurrent approach for testing address decoder faults in eFlash memories. | Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga |
| 2007 | VTS | Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. | Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2006 | VTS | An Overview of Failure Mechanisms in Embedded Flash Memories. | Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |