Peter Muhmenthaler
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
4
Active years
1991–2006
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | VTS | Session Abstract. | Ajay Khoche, Peter Muhmenthaler |
| 2005 | ITC | Compression mode diagnosis enables high volume monitoring diagnosis flow. | Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai |
| 2004 | DATE | Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. | Andreas Leininger, Michael Gssel, Peter Muhmenthaler |
| 2003 | ITC | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. | Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |
| 2002 | ITC | Outsourcing Test without Standards? | Peter Muhmenthaler |
| 2001 | DATE | Embedded tutorial: TRP: integrating embedded test and ATE. | Yervant Zorian, Paolo Prinetto, Joo Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octvio Pscoa Dias, Jorge Semio, Peter Muhmenthaler, W. Radermacher |
| 2000 | DATE | Tutorial Statement. | Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf |
| 1999 | ETS | Cost effective testing of systems on silicon: areas for optimization. | Peter Muhmenthaler |
| 1991 | ITC | Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. | H.-D. Oberle, Peter Muhmenthaler |
| 1991 | VTS | Enhanced fault modeling for DRAM test and analysis. | H.-D. Oberle, M. Maue, Peter Muhmenthaler |