Skip to content

Robert F. Molyneaux

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

7

Venues

3

Active years

1997–2007

Best venue rank

A*

Where they publish

Papers

7 indexed papers, newest first.

YearVenueTitleAuthors
2007ITCDesign for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip.Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh
2003ITCDebug and Diagnosis in the Age of System-on-a-Chip.Robert F. Molyneaux
2000ITCDFT advances in Motorola's Next-Generation 74xx PowerPCRajesh Raina, Robert Bailey, Dawit Belete, Vikram Khosa, Robert F. Molyneaux, Javier Prado, Ashutosh Razdan
2000VTSAt-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor.Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina
1999ITCDFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor.Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar
1997DACEfficient Testing of Clock Regenerator Circuits in Scan Designs.Rajesh Raina, Robert Bailey, Charles Njinda, Robert F. Molyneaux, Charlie Beh
1997ITCHow Seriously Do You Take Your Possible-Detect Faults?Rajesh Raina, Charles Njinda, Robert F. Molyneaux