Robert Van Rijsinge
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
1990–2016
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ETS | IoT: Source of test challenges. | Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singele, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes |
| 2004 | ITC | Trends in Testing Integrated Circuits. | Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge |
| 1990 | ITC | From specification to measurement: the bottleneck in analog industrial testing. | Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga |