IoT: Source of test challenges.

Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singele, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes

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