| 2026 | ETS | Testing of a 12 bit SARA And Cand Analog Scan. | Anthony Coyette, Wim Dobbelaere, Doina Dima, Arlind Billa, Krzysztof Jurga, Vladimir Zivkovic, Stephen Sunter |
| 2026 | ETS | Using Analog IJTAG to Measure ISO 26262 Metrics. | Bartlomiej Praselski, Stephen Sunter |
| 2026 | VTS | Innovative Practices Session: Applying Analog Scan to Industrial Circuits. | Stephen Sunter, Marampally Saikiran, Degang Chen, Ashok Mathur |
| 2025 | ITC | Scan Test for 99% Defect Coverage of R-2R DACs. | Stephen Sunter, Krzysztof Jurga |
| 2024 | ITC | Digital Scan and ATPG for Analog Circuits. | Stephen Sunter, Krzysztof Jurga |
| 2024 | VTS | A Method for Simulating Mixed-Signal ATE Tests. | Stephen Sunter, Vladimir Zivkovic, Bartlomiej Praselski |
| 2021 | VTS | Automated Observability Analysis for Mixed-Signal Circuits. | Stephen Sunter, Krzysztof Jurga |
| 2020 | ETS | Analog Fault Simulation - a Hot Topic! | Stephen Sunter |
| 2020 | ITC | Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. | Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2019 | ITC | Efficient Analog Defect Simulation. | Stephen Sunter |
| 2018 | ETS | Measuring mixed-signal test stimulus quality. | Krzysztof Jurga, Stephen Sunter |
| 2018 | VTS | IP session on ISO26262 EDA. | Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson |
| 2017 | ITC | A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. | Stephen Sunter, Peter Sarson |
| 2016 | ETS | Measuring defect tolerance within mixed-signal ICs. | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
| 2016 | ISCAS | Closing the loop between analog design and test. | Stephen Sunter |
| 2016 | ITC | Automated measurement of defect tolerance in mixed-signal ICs. | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
| 2015 | VTS | Special session: Hot topics: Statistical test methods. | Manuel J. Barragn, Gildas Lger, Florence Azas, Ronald D. Blanton, Adit D. Singh, Stephen Sunter |
| 2014 | ITC | Practical random sampling of potential defects for analog fault simulation. | Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren |
| 2014 | ITC | Fast BIST of I/O Pin AC specifications and inter-chip delays. | Stephen Sunter, Saghir A. Shaikh, Qing Lin |
| 2014 | VTS | Efficient Monte Carlo-based analog parametric fault modelling. | Haralampos-G. D. Stratigopoulos, Stephen Sunter |