| 2025 | ITC | Debugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up. | Min-Hsin Liu, Ding-Wei Cheng, James Chien-Mo Li, Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han Hsieh, Subhadip Kundu |
| 2024 | VLSID | Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. | Subhadip Kundu, Jais Abraham |
| 2022 | ITC | Using Custom Fault Models to Improve Understanding of Silicon Failures. | Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan |
| 2017 | ITC | Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. | Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur |
| 2016 | ITC | Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. | Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur |
| 2016 | VLSID | Post-Silicon Validation and Diagnosis. | Kanad Basu, Subhadip Kundu |
| 2015 | DATE | Fault diagnosis in designs with extreme low pin test data compressors. | Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur |
| 2015 | ISCAS | A hardware based low temperature solution for VLSI testing using decompressor side masking. | Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das |
| 2013 | DAC | An ATE assisted DFD technique for volume diagnosis of scan chains. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2013 | ETS | Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2012 | VLSID | A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2011 | VLSID | Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2010 | ISLPED | Customizing pattern set for test power reduction via improved X-identification and reordering. | S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay |