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Takahiro J. Yamaguchi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

32

Venues

5

Active years

1997–2015

Best venue rank

A

Where they publish

Papers

32 indexed papers, newest first.

YearVenueTitleAuthors
2015ITCA new method for measuring alias-free aperture jitter in an ADC output.Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma
2014ISCASA subsampling stochastic coarse-fine ADC with SNR 55.3dB and >5.8TS/s effective sample rate for an on-chip signal analyzer.James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada
2014VTSSpecial session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test.Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li
2013ASPDACDesign of a clock jitter reduction circuit using gated phase blending between self-delayed clock edges.Kiichi Niitsu, Naohiro Harigai, Daiki Hirabayashi, Daiki Oki, Masato Sakurai, Osamu Kobayashi, Takahiro J. Yamaguchi, Haruo Kobayashi
2013ITCA novel test structure for measuring the threshold voltage variance in MOSFETs.Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada
2013VTSSpecial session 12B: Panel post-silicon validation & test in huge variance era.Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas
2012ASPDACA reference-free on-chip timing jitter measurement circuit using self-referenced clock and a cascaded time difference amplifier in 65nm CMOS.Kiichi Niitsu, Masato Sakurai, Naohiro Harigai, Daiki Hirabayashi, Takahiro J. Yamaguchi, Haruo Kobayashi
2011ISCASAn equivalent-time and clocked approach for continuous-time quantization.Takahiro J. Yamaguchi, Mohamed Abbas, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Satoshi Komatsu, Kunihiro Asada
2011ITCApplication of a continuous-time level crossing quantization method for timing noise measurements.Takahiro J. Yamaguchi, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Kunihiro Asada, Mohamed Abbas, Satoshi Komatsu
2009ICASSPPhase-based alignment of two signals having partially overlapped spectra.Albert Tumewu, Kazuyuki Miyazawa, Takafumi Aoki, Takahiro J. Yamaguchi, Katsuhiko Degawa, Takayuki Akita
2009ITCA robust method for identifying a deterministic jitter model in a total jitter distribution.Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, Masahiro Ishida
2008ITCA New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa
2007ISCASAn On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007ITCData jitter measurement using a delta-time-to-voltage converter method.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007ITCAn FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma
2006ITCA Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2006ITCA Study of Per-Pin Timing Jitter Scope.Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma
2005ITCA wideband low-noise ATE-based method for measuring jitter in GHz signals.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma
2004ITCLoopback or not?Takahiro J. Yamaguchi
2004ITCA Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems.Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai
2003ITCOpen Architecture ATE and 250 Consecutive UIs.Takahiro J. Yamaguchi
2003ITCEffects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements.Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha
2002ITCMulti-GHz interface devices should be tested using external test resources.Takahiro J. Yamaguchi
2002ITCA New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter.Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie
2002VTSTiming Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha
2001ITCTesting clock distribution circuits using an analytic signal method.Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida
2001VTSA Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, David Halter, Rajesh Raina, Jim Nissen
2000ITCJitter measurements of a PowerPCTakahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe
2000VTSExtraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi
1998VTSCOMPACT: A Hybrid Method for Compressing Test Data.Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi
1997ITCAn Efficient Method for Compressing Test Data.Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha
1997ITCDynamic Testing of ADCs Using Wavelet Transforms.Takahiro J. Yamaguchi, Mani Soma