Skip to content

Ujjwal Guin

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

22

Venues

8

Active years

2011–2026

Best venue rank

A*

Where they publish

Papers

22 indexed papers, newest first.

YearVenueTitleAuthors
2026DATEUnlocking Hidden Secrets: Leveraging SRAM Aging Imprints for Sensitive Data Recovery.Zakia Tamanna Tisha, Gaines Odom, Biswajit Ray, Ujjwal Guin
2026VTSSecurity Vulnerabilities of Semiconductor Memories.Pravineeth Edara, Biresh Kumar Joardar, Zakia Tamanna Tisha, Ujjwal Guin, Habib Ur Rahman, Biswajit Ray
2024ICCADOptimizing Supply Chain Management using Permissioned Blockchains.Aritri Saha, Ujjwal Guin
2024VTSA Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs.Gaines Odom, Zakia Tamanna Tisha, Ujjwal Guin
2022DACCamSkyGate: camouflaged skyrmion gates for protecting ICs.Yuqiao Zhang, Chunli Tang, Peng Li, Ujjwal Guin
2022VTSFault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits.Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal
2021ISCASSurvey of Recent Developments for Hardware Trojan Detection.Ayush Jain, Ziqi Zhou, Ujjwal Guin
2021VTSSpecial Session: Reliability Analysis for AI/ML Hardware.Shamik Kundu, Kanad Basu, Mehdi Sadi, Twisha Titirsha, Shihao Song, Anup Das, Ujjwal Guin
2021VTSDefect Characterization and Testing of Skyrmion-Based Logic Circuits.Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal
2020VTSSpecial Session: Novel Attacks on Logic-Locking.Ayush Jain, Ujjwal Guin, M. Tanjidur Rahman, Navid Asadizanjani, Danielle Duvalsaint, R. D. Shawn Blanton
2020VTSA Zero-Cost Detection Approach for Recycled ICs using Scan Architecture.Wendong Wang, Ujjwal Guin, Adit D. Singh
2020VTSSpecial Session: The Recent Advance in Hardware Implementation of Post-Quantum Cryptography.Jiafeng Xie, Kanad Basu, Kris Gaj, Ujjwal Guin
2019CCSTGA: An Oracle-less and Topology-Guided Attack on Logic Locking.Yuqiao Zhang, Pinchen Cui, Ziqi Zhou, Ujjwal Guin
2019VLSIDTwo-Pattern ∆IDDQ Test for Recycled IC Detection.Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal
2019VTSSpecial Session: Delay Fault Testing - Present and Future.Jubayer Mahmod, Spencer K. Millican, Ujjwal Guin, Vishwani D. Agrawal
2018VLSIDA Secure Low-Cost Edge Device Authentication Scheme for the Internet of Things.Ujjwal Guin, Adit D. Singh, Mahabubul Alam, Janice Canedo, Anthony Skjellum
2018VTSModeling and test generation for combinational hardware Trojans.Ziqi Zhou, Ujjwal Guin, Vishwani D. Agrawal
2017VTSA novel design-for-security (DFS) architecture to prevent unauthorized IC overproduction.Ujjwal Guin, Ziqi Zhou, Adit D. Singh
2015ICCDPerformance optimization for on-chip sensors to detect recycled ICs.Bicky Shakya, Ujjwal Guin, Mark Tehranipoor, Domenic Forte
2014DACLow-cost On-Chip Structures for Combating Die and IC Recycling.Ujjwal Guin, Xuehui Zhang, Domenic Forte, Mohammad Tehranipoor
2013ICCDFunctional Fmax test-time reduction using novel DFTs for circuit initialization.Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor
2011VTSDesign for Bit Error Rate estimation of high speed serial links.Ujjwal Guin, Chen-Huan Chiang