| 2008 | ISLPED | Low power chips: a fabless asic perspective. | Shashank Bhonge, Vamsi Boppana |
| 2008 | VLSID | Implementing the Best Processor Cores. | Vamsi Boppana, Rahoul Varma, S. Balajee |
| 2004 | DAC | Accurate pre-layout estimation of standard cell characteristics. | Hiroaki Yoshida, Kaushik De, Vamsi Boppana |
| 2002 | VLSID | Design for Verification at the Register Transfer Level. | Indradeep Ghosh, Krishna Sekar, Vamsi Boppana |
| 2001 | ASPDAC | Cellular automata as a built in self test structure. | Biplab K. Sikdar, Debesh K. Das, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee, Parimal Pal Chaudhuri |
| 2001 | VTS | Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. | M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
| 2000 | ICCD | A Technique for Identifying RTL and Gate-Level Correspondences. | Srivaths Ravi, Niraj K. Jha, Indradeep Ghosh, Vamsi Boppana |
| 2000 | VLSID | Hierarchical Error Diagnosis Targeting RTL Circuits. | Vamsi Boppana, Indradeep Ghosh, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita |
| 2000 | VLSID | Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. | Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee |
| 2000 | VTS | Testing, Verification, and Diagnosis in the Presence of Unknowns. | Ankur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Michael S. Hsiao |
| 1999 | CAV | Model Checking Based on Sequential ATPG. | Vamsi Boppana, Sreeranga P. Rajan, Koichiro Takayama, Masahiro Fujita |
| 1999 | DAC | Multiple Error Diagnosis Based on Xlists. | Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Pradeep Bollineni |
| 1999 | VTS | Implication and Evaluation Techniques for Proving Fault Equivalence. | M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
| 1999 | VTS | On the Evaluation of Arbitrary Defect Coverage of Test Sets. | Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita |
| 1998 | ICCAD | Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits. | Vamsi Boppana, W. Kent Fuchs |
| 1998 | ITC | Modeling the unknown! Towards model-independent fault and error diagnosis. | Vamsi Boppana, Masahiro Fujita |
| 1997 | VLSID | Characterization and Implicit Identification of Sequential Indistinguishability. | Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs |
| 1997 | VTS | Diagnostic Test Pattern Generation for Sequential Circuits. | Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs |
| 1996 | EuroPar | A Parallel Algorithm for the Technology Mapping of LUT-Based FPGAs. | Vamsi Boppana, Prashant Saxena, Prithviraj Banerjee, W. Kent Fuchs, C. L. Liu |
| 1996 | ICCAD | Integrated fault diagnosis targeting reduced simulation. | Vamsi Boppana, W. Kent Fuchs |
| 1996 | ICCAD | Identification of unsettable flip-flops for partial scan and faster ATPG. | Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs |
| 1996 | ITC | Partial Scan Design Based on State Transition Modeling. | Vamsi Boppana, W. Kent Fuchs |
| 1996 | ITC | Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis. | Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs |
| 1996 | VTS | Full fault dictionary storage based on labeled tree encoding. | Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs |
| 1994 | ICCAD | Fault dictionary compaction by output sequence removal. | Vamsi Boppana, W. Kent Fuchs |
| 1994 | VLSID | A CAD Tool for Design of On-Chip Store & Generate Scheme. | Sukumar Nandi, Vamsi Boppana, Parimal Pal Chaudhuri |
| 1993 | VLSID | Delay Fault Test Generation with Cellular Automata. | Sukumar Nandi, Vamsi Boppana, Supratik Chakraborty, Parimal Pal Chaudhuri, Samir Roy |