Vincent Huard
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
4
Active years
2015–2023
Best venue rank
A
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | IOLTS | Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. | Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard |
| 2018 | DATE | NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. | Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel |
| 2017 | DATE | Workload dependent reliability timing analysis flow. | Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel |
| 2017 | IOLTS | Investigation of critical path selection for in-situ monitors insertion. | Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel |
| 2017 | IOLTS | Dynamic aging compensation and Safety measures in Automotive environment. | Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix |
| 2017 | ITC | Cognitive approach to support dynamic aging compensation. | Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix |
| 2016 | DATE | Early failure prediction by using in-situ monitors: Implementation and application results. | Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel |
| 2016 | DATE | Study of workload impact on BTI HCI induced aging of digital circuits. | Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel |
| 2016 | DATE | Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. | Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel |
| 2016 | IOLTS | Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. | Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard |
| 2016 | IOLTS | Activity profiling: Review of different solutions to develop reliable and performant design. | Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel |
| 2016 | VTS | Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. | Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard |
| 2015 | DATE | Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. | M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel |