Wim Dobbelaere
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
21
Venues
4
Active years
2014–2026
Best venue rank
B
Where they publish
Papers
21 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Testing of a 12 bit SARA And Cand Analog Scan. | Anthony Coyette, Wim Dobbelaere, Doina Dima, Arlind Billa, Krzysztof Jurga, Vladimir Zivkovic, Stephen Sunter |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2023 | ETS | High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. | Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2020 | ETS | Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. | Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | ETS | Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. | Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen |
| 2020 | ITC | Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. | Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | VTS | Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. | Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2019 | ITC | Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. | Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2019 | VTS | Innovative Practices on Automotive Test. | Wim Dobbelaere, Marco Restifo, Peter Sarson |
| 2018 | ISCAS | Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. | Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama |
| 2018 | VTS | Innovative practices on quality levels of A/MS devices. | Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick |
| 2017 | ETS | A very low cost and highly parallel DfT method for analog and mixed-signal circuits. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ETS | Automatic testing of analog ICs for latent defects using topology modification. | Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ITC | Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2016 | ITC | Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. | Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2016 | ITC | Analog fault coverage improvement using final-test dynamic part average testing. | Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen |
| 2016 | ITC | Effective DC fault models and testing approach for open defects in analog circuits. | Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren |
| 2015 | ETS | Automatic generation of autonomous built-in observability structures for analog circuits. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2015 | VTS | Automated testing of mixed-signal integrated circuits by topology modification. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2014 | ETS | Optimization of analog fault coverage by exploiting defect-specific masking. | Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere |
| 2014 | ITC | Design and test of analog circuits towards sub-ppm level. | Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen |