Wojciech Maly
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
53
Venues
8
Active years
1984–2010
Best venue rank
A*
Where they publish
Papers
53 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | VTS | Evaluating yield and testing impact of sub-wavelength lithography. | Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly |
| 2009 | ISCAS | Adder Circuits with Transistors using Independently Controlled Gates. | Marcus Weis, Andrzej Pfitzner, Dominik Kasprowicz, Rainer Emling, Wojciech Maly, Doris Schmitt-Landsiedel |
| 2008 | ICCAD | More Moore: foolish, feasible, or fundamentally different? | Rob Aitken, Jerry Bautista, Wojciech Maly, Jan M. Rabaey |
| 2008 | ICCD | Is there always performance overhead for regular fabric? | Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly, Andrzej Pfitzner, Dominik Kasprowicz |
| 2007 | DAC | OPC-Free and Minimally Irregular IC Design Style. | Wojciech Maly, Yi-Wei Lin, Malgorzata Marek-Sadowska |
| 2006 | DATE | Extraction of defect density and size distributions from wafer sort test results. | Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton |
| 2004 | ASPDAC | 2.5D system integration: a design driven system implementation schema. | Yangdong Steve Deng, Wojciech Maly |
| 2004 | ITC | Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. | Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
| 2003 | ICCD | Physical Design of the "2.5D" Stacked System. | Yangdong Deng, Wojciech Maly |
| 2003 | ITC | Deformations of IC Structure in Test and Yield Learning. | Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |
| 2003 | ITC | Progressive Bridge Identification. | Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton |
| 2002 | ITC | Fault Tuples in Diagnosis of Deep-Submicron Circuits. | Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
| 2001 | DAC | IC Design in High-Cost Nanometer-Technologies Era. | Wojciech Maly |
| 2001 | ITC | Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. | John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly |
| 2001 | VTS | Enabling Embedded Memory Diagnosis via Test Response Compression. | John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare |
| 1998 | DATE | Performance - Manufacturability Tradeoffs in IC Design. | Hans T. Heineken, Wojciech Maly |
| 1998 | DATE | Design-Manufacturing Interface: Part I - Vision. | Wojciech Maly, Pranab K. Nag, Hans T. Heineken, Jitendra Khare |
| 1998 | DATE | Design-Manufacturing Interface: Part II - Applications. | Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, P. Simon |
| 1998 | ITC | Current signatures: application [to CMOS]. | Anne E. Gattiker, Wojciech Maly |
| 1998 | ITC | Toward understanding "Iddq-only" fails. | Anne E. Gattiker, Wojciech Maly |
| 1997 | DAC | CAD at the Design-Manufacturing Interface. | Hans T. Heineken, Jitendra Khare, Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Witold A. Pleskacz |
| 1997 | ITC | Current Signatures: Application. | Anne E. Gattiker, Wojciech Maly |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | ITC | To DFT or Not to DFT? | Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly |
| 1996 | DATE | Iddq Testing for High Performance CMOS - The Next Ten Years. | Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly |
| 1996 | ICCAD | Interconnect yield model for manufacturability prediction in synthesis of standard cell based designs. | Hans T. Heineken, Wojciech Maly |
| 1996 | ICCAD | Design for manufacturability in submicron domain. | Wojciech Maly, Hans T. Heineken, Jitendra Khare, Pranab K. Nag |
| 1996 | ICCD | Modeling the Difficulty of Sequential Automatic Test Pattern Generation. | Thomas E. Marchok, Wojciech Maly |
| 1996 | ITC | New and Not-So-New Test Challenges of the Next Decade. | Wojciech Maly |
| 1996 | ITC | I | Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly |
| 1996 | VTS | Current signatures [VLSI circuit testing]. | Anne E. Gattiker, Wojciech Maly |
| 1996 | VTS | Fault characterization of standard cell libraries using inductive contamination. | Jitendra Khare, Wojciech Maly, Nathan Tiday |
| 1995 | DAC | On Test Set Preservation of Retimed Circuits. | Aiman H. El-Maleh, Thomas E. Marchok, Janusz Rajski, Wojciech Maly |
| 1995 | DATE | Complexity of sequential ATPG. | Thomas E. Marchok, Aiman El-Maleh, Wojciech Maly, Janusz Rajski |
| 1995 | ITC | Inductive Contamination Analysis (ICA) with SRAM Application. | Jitendra Khare, Wojciech Maly |
| 1994 | DAC | Cost of Silicon Viewed from VLSI Design Perspective. | Wojciech Maly |
| 1994 | ITC | Feasibility Study of Smart Substrate Multichip Modules. | Anne E. Gattiker, Wojciech Maly |
| 1994 | ITC | Integration of Design, Manufacturing and Testing. | Wojciech Maly |
| 1991 | DAC | What is Design for Manufacturability (DFM)? (Panel Abstract). | Wojciech Maly |
| 1991 | ITC | Improving the Quality of Test Education. | Wojciech Maly |
| 1991 | ITC | Fault Modeling for the Testing of Mixed Integrated Circuits. | Anne Meixner, Wojciech Maly |
| 1991 | ITC | Stuck Fault and Current Testing Comparison Using CMOS Chip Test. | Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske |
| 1990 | ITC | Current testing. | Wojciech Maly |
| 1990 | ITC | CMOS Bridging Fault Detection. | Thomas M. Storey, Wojciech Maly |
| 1990 | ITC | CMOS bridging fault detection. | Thomas M. Storey, Wojciech Maly |
| 1989 | ICCAD | Layout-driven test generation. | Phil Nigh, Wojciech Maly |
| 1989 | ITC | Process Monitoring Oriented IC Testing. | Wojciech Maly, Samir B. Naik |
| 1988 | ICCAD | Built-in current testing-feasibility study. | Wojciech Maly, Phil Nigh |
| 1988 | ICCAD | Testing oriented analysis of CMOS ICs with opens. | Wojciech Maly, Pranab K. Nag, Phil Nigh |
| 1988 | ICCD | Current sensing for built-in testing of CMOS circuits. | Derek B. I. Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly |
| 1987 | DAC | Realistic Fault Modeling for VLSI Testing. | Wojciech Maly |
| 1986 | DAC | Optimal order of the VLSI IC testing sequence. | Wojciech Maly |
| 1984 | ITC | Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. | Wojciech Maly, F. Joel Ferguson, John Paul Shen |