| 2020 | ITC | Unsupervised Root-Cause Analysis for Integrated Systems. | Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | ITC | Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation. | Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | VTS | Board-Level Functional Fault Identification using Streaming Data. | Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | VTS | Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. | Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | VTS | IP Session on Machine Learning Applications in IC Test-Related Tasks. | Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos |
| 2018 | ICCAD | Failure prediction based on anomaly detection for complex core routers. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | ITC | Self-Learning Health-Status Analysis for a Core Router System. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | ITC | Fine-Grained Adaptive Testing Based on Quality Prediction. | Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2017 | DATE | RetroDMR: Troubleshooting non-deterministic faults with retrospective DMR. | Ting Wang, Yannan Liu, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu |
| 2017 | ETS | Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. | Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu |
| 2017 | ITC | Changepoint-based anomaly detection in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2017 | ITC | Symbol-based health-status analysis in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2016 | ITC | Accurate anomaly detection using correlation-based time-series analysis in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2015 | ASPDAC | On test syndrome merging for reasoning-based board-level functional fault diagnosis. | Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu |
| 2015 | ASPDAC | Self-learning and adaptive board-level functional fault diagnosis. | Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu |
| 2014 | ITC | Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. | Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2014 | VTS | Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? | Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda |
| 2013 | ETS | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2013 | ETS | Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. | Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2013 | ITC | AgentDiag: An agent-assisted diagnostic framework for board-level functional failures. | Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu |
| 2012 | ETS | Re-using chip level DFT at board level. | Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
| 2012 | ETS | Diagnostic system based on support-vector machines for board-level functional diagnosis. | Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty |
| 2012 | ITC | Are industrial test problems real problems? I thought research has resolved them all! | Xinli Gu |
| 2011 | ASPDAC | Deterministic test for the reproduction and detection of board-level functional failures. | Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2011 | ETS | Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. | Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2011 | ITC | The gap: Test challenges in Asia manufacturing field. | Xinli Gu |
| 2011 | ITC | Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. | Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu |
| 2010 | ITC | Board-level fault diagnosis using an error-flow dictionary. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2010 | VTS | Board-level fault diagnosis using Bayesian inference. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2009 | ITC | Physical defect modeling for fault insertion in system reliability test. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2006 | ITC | Design for Board and System Level Structural Test and Diagnosis. | Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu |
| 2005 | ITC | A practical perspective on reducing ASIC NTFs. | Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow |
| 2004 | ITC | Realizing High Test Quality Goals with Smart Test Resource Usage. | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2004 | ITC | At-Speed Interconnect Test and Diagnosis of External Memories on a System. | Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung |
| 2002 | ITC | Re-Using DFT Logic for Functional and Silicon Debugging Test. | Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung |
| 2001 | ITC | An effort-minimized logic BIST implementation method. | Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian |
| 1998 | ITC | A new approach to scan chain reordering using physical design information. | Mokhtar Hirech, James Beausang, Xinli Gu |
| 1997 | DATE | A controller testability analysis and enhancement technique. | Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng |
| 1995 | ITC | An Efficient and Economic Partitioning Approach for Testability. | Xinli Gu, Krzysztof Kuchcinski, Zebo Peng |
| 1995 | VTS | RT level testability-driven partitioning. | Xinli Gu |