Yingdi Liu
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
3
Active years
2016–2024
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2024 | VLSID | X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology. | Ashrith S. Harith, Yingdi Liu, Nilanjan Mukherjee, Jeffrey Mayer |
| 2020 | ITC | X-Tolerant Tunable Compactor for In-System Test. | Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak |
| 2019 | ITC | Test Time and Area Optimized BrST Scheme for Automotive ICs. | Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki |
| 2018 | ITC | Deterministic Stellar BIST for In-System Automotive Test. | Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer |
| 2018 | VTS | Staggered ATPG with capture-per-cycle observation test points. | Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer |
| 2016 | ITC | Minimal area test points for deterministic patterns. | Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer |