Yong Chang Kim
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
2001–2003
Best venue rank
National
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | VLSID | Exclusive Test and its Applications to Fault Diagnosis. | Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja |
| 2002 | VLSID | Multiple Faults: Modeling, Simulation and Test. | Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja |
| 2001 | ITC | Combinational test generation for various classes of acyclic sequential circuits. | Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja |
| 2001 | VLSID | Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model. | Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agrawal |