Yousuke Miyake
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
4
Active years
2012–2020
Best venue rank
C
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | IOLTS | On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. | Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura |
| 2020 | VTS | Innovative Test Practices in Asia. | Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama |
| 2019 | PRDC | On-Chip Delay Measurement for In-Field Test of FPGAs. | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
| 2014 | PRDC | Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA. | Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara |
| 2012 | ETS | On-chip temperature and voltage measurement for field testing. | Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |