| 2012 | ETS | Diagnostic system based on support-vector machines for board-level functional diagnosis. | Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty |
| 2011 | ITC | Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. | Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu |
| 2010 | ITC | Board-level fault diagnosis using an error-flow dictionary. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2010 | VTS | Board-level fault diagnosis using Bayesian inference. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2009 | ITC | Physical defect modeling for fault insertion in system reliability test. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2007 | DATE | SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. | Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang |
| 2007 | ETS | A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. | Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
| 2007 | ITC | A low cost test data compression technique for high n-detection fault coverage. | Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar |
| 2006 | DATE | Test set enrichment using a probabilistic fault model and the theory of output deviations. | Zhanglei Wang, Krishnendu Chakrabarty, Michael Gssel |
| 2005 | ETS | Built-in self-test of molecular electronics-based nanofabrics. | Zhanglei Wang, Krishnendu Chakrabarty |
| 2005 | ITC | Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. | Zhanglei Wang, Krishnendu Chakrabarty |
| 2005 | ITC | Test data compression for IP embedded cores using selective encoding of scan slices. | Zhanglei Wang, Krishnendu Chakrabarty |