Coupling reverse engineering and SAT to tackle NP-complete arithmetic circuitry verification in ∼O(# of gates).
Yi Diao, Xing Wei, Tak-Kei Lam, Yu-Liang Wu
Browse the full ASPDAC paper archive.
Yi Diao, Xing Wei, Tak-Kei Lam, Yu-Liang Wu
Browse the full ASPDAC paper archive.