Testing Reliability of Smart Electronic Locks: Analysis and the First Steps Towards.
Ondrej Cekan, Jakub Podivinsky, Jakub Lojda, Richard Panek, Martin Krcma, Zdenek Kotsek
Browse the full DSD paper archive.
Ondrej Cekan, Jakub Podivinsky, Jakub Lojda, Richard Panek, Martin Krcma, Zdenek Kotsek
Browse the full DSD paper archive.