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BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell.
Stefan Holst
,
Ruijun Ma
,
Xiaoqing Wen
,
Aibin Yan
,
Hui Xu
Venue
B
ETS
Year
2023
Proceedings
ETS
DBLP record
conf/ets/HolstMWYX23 ↗
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