Xiaoqing Wen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
73
Venues
15
Active years
1990–2026
Best venue rank
A*
Where they publish
Papers
73 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ISCAS | Algorithm-Aided Design and Verification for Multiple-Node-Upset-Recovery Latches. | Zhiyuan Pei, Jing Li, Haroon Waris, M. Shahzad Younis, Aibin Yan, Jiahui Deng, Yilin Gui, Xiaoqing Wen |
| 2025 | DATE | Efficient Modulated State Space Model for Mixed-Type Wafer Defect Pattern Recognition. | Mu Nie, Shidong Zhu, Aibin Yan, Cheng Zhuo, Xiaoqing Wen, Tianming Ni |
| 2025 | DATE | NVSRLO: A FeFET-Based Non-Volatile and SEU-Recoverable Latch Design with Optimized Overhead. | Aibin Yan, Wangjin Jiang, Han Bao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard |
| 2025 | EuroSys | Achilles: Efficient TEE-Assisted BFT Consensus via Rollback Resilient Recovery. | Jianyu Niu, Xiaoqing Wen, Guanlong Wu, Shengqi Liu, Jiangshan Yu, Yinqian Zhang |
| 2025 | ISCAS | TNURML: Triple-Node-Upset-Recovery Magnetic Latch Design with Non-Volatility for Aerospace Applications. | Aibin Yan, Zhiyuan Pei, Xing Guo, Jie Song, Cuiyun Jiang, Huaguo Liang, Xiaoqing Wen, Patrick Girard |
| 2024 | ISCAS | Nonvolatile and SEU-Recoverable Latch Based on FeFET and CMOS for Energy-Harvesting Devices. | Aibin Yan, Zhuoyuan Lin, Guangzhu Liu, Qingyang Zhang, Zhengfeng Huang, Jie Cui, Xiaoqing Wen, Patrick Girard |
| 2023 | DATE | High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. | Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard |
| 2023 | ETS | BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. | Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu |
| 2023 | ISCAS | Design of Low-Cost Approximate CMOS Full Adders. | Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen |
| 2022 | DATE | SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments. | Aibin Yan, Zhixing Li, Shiwei Huang, Zijie Zhai, Xiangyu Cheng, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard |
| 2022 | VLSID | Power and Energy Safe Real-Time Multi-Core Task Scheduling. | Kalyan Baital, Amlan Chakrabarti, Biswadeep Chatterjee, Stefan Holst, Xiaoqing Wen |
| 2022 | VTS | A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. | Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard |
| 2021 | DATE | Reliability-Driven Neuromorphic Computing Systems Design. | Qi Xu, Junpeng Wang, Hao Geng, Song Chen, Xiaoqing Wen |
| 2021 | ISCAS | TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. | Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen |
| 2021 | ISPA | A Blockchain-based Verified Locating Scheme for IoT Devices. | Zhenyu Guan, Xiaoqing Wen, Dawei Li, Mai Xu, Haihua Li |
| 2020 | DAC | HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical Applications. | Aibin Yan, Xiangfeng Feng, Xiaohu Zhao, Hang Zhou, Jie Cui, Zuobin Ying, Patrick Girard, Xiaoqing Wen |
| 2020 | ISCAS | Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. | Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen |
| 2020 | ITC | Logic Fault Diagnosis of Hidden Delay Defects. | Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen |
| 2019 | DATE | Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications. | Aibin Yan, Yuanjie Hu, Jie Song, Xiaoqing Wen |
| 2019 | ETS | STAHL: A Novel Scan-Test-Aware Hardened Latch Design. | Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu |
| 2019 | ITC | Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. | Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2019 | PRDC | Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test. | Stefan Holst, Shiling Shi, Xiaoqing Wen |
| 2018 | ETS | The impact of production defects on the soft-error tolerance of hardened latches. | Stefan Holst, Ruijun Ma, Xiaoqing Wen |
| 2017 | ITC | Analysis and mitigation or IR-Drop induced scan shift-errors. | Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen |
| 2016 | ETS | SAT-based post-processing for regional capture power reduction in at-speed scan test generation. | Stephan Eggersgl, Kohei Miyase, Xiaoqing Wen |
| 2015 | DATE | GPU-accelerated small delay fault simulation. | Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2015 | ETS | Identification of high power consuming areas with gate type and logic level information. | Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara |
| 2015 | ETS | A soft-error tolerant TCAM using partial don't-care keys. | Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase |
| 2014 | ICCAD | Data-parallel simulation for fast and accurate timing validation of CMOS circuits. | Eric Schneider, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2013 | VLSID | On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. | Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang |
| 2012 | ETS | Power-aware testing: The next stage. | Xiaoqing Wen |
| 2012 | ITC | On pinpoint capture power management in at-speed scan test generation. | Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang |
| 2012 | VTS | A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. | Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara |
| 2011 | DATE | Transition-Time-Relation based capture-safety checking for at-speed scan test generation. | Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara |
| 2011 | ISLPED | SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich |
| 2011 | ITC | Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing. | Yi-Tsung Lin, Jiun-Lang Huang, Xiaoqing Wen |
| 2011 | ITC | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2011 | VTS | Power-aware test generation with guaranteed launch safety for at-speed scan testing. | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor |
| 2011 | VTS | Special session 5B: Panel How much toggle activity should we be testing with? | Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg |
| 2010 | DDECS | Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. | Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen |
| 2010 | ETS | On estimation of NBTI-Induced delay degradation. | Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura |
| 2010 | ITC | Is test power reduction through X-filling good enough? | Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed |
| 2009 | ICCAD | A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara |
| 2009 | PRDC | A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara |
| 2008 | DATE | Power-Aware Testing and Test Strategies for Low Power Devices. | Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen |
| 2008 | DATE | Test Strategies for Low Power Devices. | C. P. Ravikumar, Mokhtar Hirech, Xiaoqing Wen |
| 2008 | DDECS | Diagnosis of Realistic Defects Based on the X-Fault Model. | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen |
| 2008 | ETS | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | ICCAD | Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara |
| 2008 | ITC | Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. | Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li |
| 2008 | ITC | Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. | Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase |
| 2007 | DAC | Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja |
| 2007 | ETS | Embedded Tutorial on Low Power Test. | Nicola Nicolici, Xiaoqing Wen |
| 2007 | ICCAD | Estimation of delay test quality and its application to test generation. | Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo |
| 2007 | ITC | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2006 | ASPDAC | A dynamic test compaction procedure for high-quality path delay testing. | Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2006 | ICCD | Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja |
| 2006 | ITC | A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. | Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu |
| 2006 | ITC | A Framework of High-quality Transition Fault ATPG for Scan Circuits. | Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2006 | VTS | A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita |
| 2005 | ASPDAC | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. | Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty |
| 2005 | DAC | Path delay test compaction with process variation tolerance. | Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2005 | DATE | At-Speed Logic BIST for IP Cores. | B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Jin Woo Cho, J. Park, Hao-Jan Chao, Shianling Wu |
| 2005 | ICCD | At-Speed Logic BIST Architecture for Multi-Clock Designs. | Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo |
| 2005 | ITC | UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang |
| 2005 | ITC | Low-capture-power test generation for scan-based at-speed testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2005 | PRDC | Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. | Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen |
| 2005 | VTS | On Low-Capture-Power Test Generation for Scan Testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | ICCAD | On per-test fault diagnosis using the X-fault model. | Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | ITC | VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. | Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai |
| 1996 | ICCAD | A new method towards achieving global optimality in technology mapping. | Xiaoqing Wen, Kewal K. Saluja |
| 1992 | ITC | Testable Designs of Sequential Circuits Under Highly Observable Condition. | Xiaoqing Wen, Kozo Kinoshita |
| 1990 | ITC | A testable design of logic circuits under highly observable condition. | Xiaoqing Wen, Kozo Kinoshita |