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VirtualScan: A New Compressed Scan Technology for Test Cost Reduction.

Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai

VenueAITC
Year2004
ProceedingsITC

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