Laung-Terng Wang
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
22
Venues
7
Active years
1984–2014
Best venue rank
A
Where they publish
Papers
22 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | ETS | GPU-based timing-aware test generation for small delay defects. | Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, James Chien-Mo Li, Michael S. Hsiao, Laung-Terng Wang |
| 2013 | ITC | A circular pipeline processing based deterministic parallel test pattern generator. | Kuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang |
| 2013 | VLSID | On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. | Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang |
| 2012 | ITC | On pinpoint capture power management in at-speed scan test generation. | Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang |
| 2011 | ITC | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2010 | VTS | CSER: BISER-based concurrent soft-error resilience. | Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li |
| 2008 | ITC | Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. | Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li |
| 2007 | ITC | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2006 | ICCD | Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja |
| 2006 | ITC | A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. | Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu |
| 2006 | VTS | A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita |
| 2005 | DATE | At-Speed Logic BIST for IP Cores. | B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Jin Woo Cho, J. Park, Hao-Jan Chao, Shianling Wu |
| 2005 | ICCD | At-Speed Logic BIST Architecture for Multi-Clock Designs. | Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo |
| 2005 | ITC | UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang |
| 2005 | ITC | Low-capture-power test generation for scan-based at-speed testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2005 | ITC | Test compression and logic BIST at your fingertips. | Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu |
| 2005 | VTS | On Low-Capture-Power Test Generation for Scan Testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | ICCAD | On per-test fault diagnosis using the X-fault model. | Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | ITC | VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. | Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai |
| 1986 | ITC | Circuits for Pseudo-Exhaustive Test Pattern Generation. | Laung-Terng Wang, Edward J. McCluskey |
| 1986 | ITC | A Hybrid Design of Maximum-Length Sequence Generators. | Laung-Terng Wang, Edward J. McCluskey |
| 1984 | ITC | Self-Testing of Embedded RAMs. | Zuhi Sun, Laung-Terng Wang |