A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip.

A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, Matteo Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi

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