Rudolf Ullmann
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
4
Active years
2014–2026
Best venue rank
B
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis. | Simone Anedda, Paolo Bernardi, Matteo Coppetta, Giorgio Insinga, Tommaso Montedoro, Annachiara Ruospo, Rudolf Ullmann, Felix Tengler |
| 2025 | DATE | Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. | Paolo Bernardi, B. Borio, Giorgio Insinga, B. Mendicino, M. Battilana, Matteo Coppetta, N. Mautone, Pierre Scaramuzza, Felix Tengler, Rudolf Ullmann |
| 2024 | ITC | A graph-based algorithm for NVM address decoders testing. | Pierre Scaramuzza, Thomas Kern, Matteo Coppetta, Alessandro Grossi, Rudolf Ullmann |
| 2023 | ETS | Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. | Giorgio Insinga, M. Battilana, Matteo Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann |
| 2022 | ETS | Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. | Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, Matteo Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann |
| 2022 | IOLTS | Recent Trends and Perspectives on Defect-Oriented Testing. | Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu |
| 2019 | ETS | A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. | A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, Matteo Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi |
| 2017 | IOLTS | Robustness in automotive electronics: An industrial overview of major concerns. | Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Snchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner |
| 2014 | ITC | Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. | Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase |