Paolo Bernardi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
76
Venues
10
Active years
2003–2026
Best venue rank
B
Where they publish
Papers
76 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis. | Simone Anedda, Paolo Bernardi, Matteo Coppetta, Giorgio Insinga, Tommaso Montedoro, Annachiara Ruospo, Rudolf Ullmann, Felix Tengler |
| 2026 | ETS | Advances in Testing and Reliability Benchmarks. | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Giusy Iaria, Giacomo Perlo, Irith Pomeranz, Antonio Porsia, Annachiara Ruospo, Ernesto Snchez, Vittorio Turco |
| 2026 | ETS | Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph. | Paolo Bernardi, Lorenzo Cardone, Stefano Quer |
| 2026 | IOLTS | Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling. | Giusy Iaria, Paolo Bernardi, Claudia Bertani, Giuseppe Garozzo, Vincenzo Tancorre |
| 2026 | VTS | VTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award. | Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu |
| 2025 | DATE | Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. | Paolo Bernardi, B. Borio, Giorgio Insinga, B. Mendicino, M. Battilana, Matteo Coppetta, N. Mautone, Pierre Scaramuzza, Felix Tengler, Rudolf Ullmann |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ITC | System-Level Test techniques for Automotive SoCs. | Francesco Angione, Paolo Bernardi, Riccardo Cantoro |
| 2025 | VTS | Special Session: Trustworthy Hardware-AI at the Cloud. | Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Snchez, Arani Sinha, Vittorio Turco |
| 2024 | ETS | Optimizing System-Level Test Program Generation via Genetic Programming. | Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian |
| 2023 | DDECS | Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. | Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
| 2023 | IOLTS | About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. | Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
| 2023 | VTS | A guided debugger-based fault injection methodology for assessing functional test programs. | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
| 2022 | ETS | Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. | Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicol Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Snchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | ETS | An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. | Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | ETS | Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. | Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, Matteo Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann |
| 2022 | IOLTS | Recent Trends and Perspectives on Defect-Oriented Testing. | Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu |
| 2022 | ITC | An innovative Strategy to Quickly Grade Functional Test Programs. | Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2021 | DDECS | Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. | Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli |
| 2021 | IOLTS | System-Level Test: State of the Art and Challenges. | Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda |
| 2020 | DDECS | Applicative System Level Test introduction to Increase Confidence on Screening Quality. | Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali |
| 2019 | DATE | Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. | Paolo Bernardi, Riccardo Cantoro, Andrea Floridia, Davide Piumatti, C. Pogonea, Annachiara Ruospo, Ernesto Snchez, Sergio de Luca, Alessandro Sansonetti |
| 2019 | DDECS | Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. | F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi |
| 2019 | ETS | A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. | A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, Matteo Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi |
| 2017 | DATE | A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. | Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Snchez, C. M. Villa, Federico Venini |
| 2017 | IOLTS | Robustness in automotive electronics: An industrial overview of major concerns. | Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Snchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner |
| 2017 | IOLTS | On the in-field test of embedded memories. | Paolo Bernardi, Marco Restifo, Ernesto Snchez, Matteo Sonza Reorda |
| 2016 | DDECS | An effective approach for functional test programs compaction. | Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda |
| 2016 | VTS | Thermal issues in test: An overview of the significant aspects and industrial practice. | Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser |
| 2015 | DATE | Exploring the impact of functional test programs re-used for power-aware testing. | Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda |
| 2015 | ETS | Software-based self-test techniques of computational modules in dual issue embedded processors. | Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Snchez, Alessandro Sansonetti |
| 2014 | DATE | An effective approach to automatic functional processor test generation for small-delay faults. | Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker |
| 2014 | DDECS | An intra-cell defect grading tool. | Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi |
| 2013 | DATE | On-line functionally untestable fault identification in embedded processor cores. | Paolo Bernardi, Michele Bonazza, Ernesto Snchez, Matteo Sonza Reorda, Oscar Ballan |
| 2013 | IOLTS | A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. | Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Snchez |
| 2013 | IOLTS | Increasing fault coverage during functional test in the operational phase. | Mauricio de Carvalho, Paolo Bernardi, Ernesto Snchez, Matteo Sonza Reorda, Oscar Ballan |
| 2012 | DDECS | A SBST strategy to test microprocessors' Branch Target Buffer. | Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2012 | ETS | On-line software-based self-test of the Address Calculation Unit in RISC processors. | Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Snchez, Matteo Sonza Reorda, Oscar Ballan |
| 2011 | DATE | Fault grading of software-based self-test procedures for dependable automotive applications. | Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Oscar Ballan |
| 2011 | DDECS | Optimized embedded memory diagnosis. | Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi |
| 2011 | IOLTS | An effective methodology for on-line testing of embedded microprocessors. | Paolo Bernardi, Lyl M. Ciganda, Ernesto Snchez, Matteo Sonza Reorda |
| 2010 | DDECS | Cumulative embedded memory failure bitmap display & analysis. | Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone |
| 2010 | ETS | An adaptive tester architecture for volume diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda |
| 2010 | ITC | A programmable BIST for DRAM testing and diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang |
| 2010 | ITC | A tester architecture suitable for MEMS calibration and testing. | Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria |
| 2009 | DDECS | An efficient fault simulation technique for transition faults in non-scan sequential circuits. | Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda |
| 2009 | DDECS | An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs. | Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda |
| 2009 | ETS | Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Snchez, Matteo Sonza Reorda |
| 2009 | IOLTS | An I-IP based approach for the monitoring of NBTI effects in SoCs. | C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi |
| 2009 | IOLTS | Evaluating Alpha-induced soft errors in embedded microprocessors. | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
| 2009 | VTS | DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda |
| 2008 | DATE | An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers. | Paolo Bernardi, Matteo Sonza Reorda |
| 2008 | DDECS | SoC Symbolic Simulation: a case study on delay fault testing. | Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi |
| 2008 | ETS | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
| 2008 | ITC | Robust Design-for-Productization Practices for High Quality Automotive Products. | Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello |
| 2008 | VTS | A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. | Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2007 | AINA | Agri-Food Traceability Management using a RFID System with Privacy Protection. | Paolo Bernardi, Claudio Demartini, Filippo Gandino, Bartolomeo Montrucchio, Maurizio Rebaudengo, Erwing Ricardo Sanchez |
| 2007 | DDECS | Extended Fault Detection Techniques for Systems-on-Chip. | Paolo Bernardi, Letcia Maria Veiras Bolzani, Matteo Sonza Reorda |
| 2007 | ETS | On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. | Paolo Bernardi, Michelangelo Grosso, Ernesto Snchez, Matteo Sonza Reorda |
| 2007 | IOLTS | A Hybrid Approach to Fault Detection and Correction in SoCs. | Paolo Bernardi, Letcia Maria Veiras Bolzani, Matteo Sonza Reorda |
| 2006 | CEC | An Evolutionary Methodology to Enhance Processor Software-Based Diagnosis. | Paolo Bernardi, Ernesto Snchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda |
| 2006 | DATE | An effective technique for minimizing the cost of processor software-based diagnosis in SoCs. | Paolo Bernardi, Ernesto Snchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda |
| 2006 | DDECS | Test Considerations about the Structured ASIC Paradigm. | Paolo Bernardi, Michelangelo Grosso |
| 2006 | ITC | Embedded Memory Diagnosis: An Industrial Workflow. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | VTS | On the Automation of the Test Flow of Complex SoCs. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | VTS | A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2005 | DSN | On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. | Paolo Bernardi, Letcia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante |
| 2005 | ETS | Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2005 | IOLTS | Integrating BIST Techniques for On-Line SoC Testing. | Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Snchez, Matteo Sonza Reorda |
| 2004 | DATE | Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. | M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin |
| 2004 | DATE | Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study. | Paolo Bernardi, Guido Masera, Federico Quaglio, Matteo Sonza Reorda |
| 2004 | IOLTS | On the Evaluation of SEU Sensitiveness in SRAM-Based FPGAs. | Paolo Bernardi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante |
| 2003 | DATE | A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories. | Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |
| 2003 | ETFA | An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores. | Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2003 | IOLTS | Analyzing SEU Effects in SRAM-based FPGAs. | Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori |
| 2003 | ITC | Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. | Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante |