Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
FPGA
/
Paper
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis.
N. Pete Sedcole
,
Peter Y. K. Cheung
Venue
A
FPGA
Year
2007
Proceedings
FPGA
DBLP record
conf/fpga/SedcoleC07 ↗
Browse the full
FPGA paper archive
.