A BIST scheme for testing and repair of multi-mode power switches.
Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty
Browse the full IOLTS paper archive.
Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty
Browse the full IOLTS paper archive.