| 2019 | ETS | K3 TAM Optimization for Testing 3D-SoCs using Non-Regular Time-Division-Multiplexing. | Panagiotis Georgiou, Iakovos Theodosopoulos, Xrysovalantis Kavousianos |
| 2018 | IOLTS | Fault-Independent Test-Generation for Software-Based Self-Testing. | Panagiotis Georgiou, Xrysovalantis Kavousianos, Riccardo Cantoro, Matteo Sonza Reorda |
| 2017 | DATE | Critical path - Oriented & thermal aware X-filling for high un-modeled defect coverage. | Fotios Vartziotis, Xrysovalantis Kavousianos |
| 2016 | ETS | Two-dimensional time-division multiplexing for 3D-SoCs. | Panagiotis Georgiou, Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2015 | ETS | A branch-&-bound algorithm for TAM optimization in multi-Vdd SoCs. | Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2015 | ITC | Test-access-mechanism optimization for multi-Vdd SoCs. | Fotios Vartziotis, Xrysovalantis Kavousianos, Panagiotis Georgiou, Krishnendu Chakrabarty |
| 2014 | DATE | Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing. | Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Rubin A. Parekhji, Arvind Jain |
| 2013 | DATE | Testing for SoCs with advanced static and dynamic power-management capabilities. | Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2012 | ETS | Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. | Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji |
| 2011 | ETS | Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. | Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty |
| 2011 | ICCAD | Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs. | Vasileios Tenentes, Xrysovalantis Kavousianos |
| 2011 | IOLTS | A BIST scheme for testing and repair of multi-mode power switches. | Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty |
| 2011 | VLSID | A Robust and Reconfigurable Multi-mode Power Gating Architecture. | Zhaobo Zhang, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Yiorgos Tsiatouhas |
| 2010 | DATE | Defect aware X-filling for low-power scan testing. | S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2009 | DATE | Generation of compact test sets with high defect coverage. | Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2009 | DATE | LFSR-based test-data compression with self-stoppable seeds. | M. Koutsoupia, Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos |
| 2008 | DATE | State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. | Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros |
| 2006 | DATE | Efficient test-data compression for IP cores using multilevel Huffman coding. | Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos |
| 2003 | ISCAS | Virtual-scan: a novel approach for software-based self-testing of microprocessors. | Giorgos Dimitrakopoulos, Xrysovalantis Kavousianos, Dimitris Nikolos |
| 2001 | IOLTS | A New Reseeding Technique for LFSR-Based Test Pattern Generation. | Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
| 2001 | IOLTS | On the Design of Self-Testing Checkers for Modified Berger Codes. | Stanislaw J. Piestrak, Dimitris Bakalis, Xrysovalantis Kavousianos |
| 2000 | ITC | Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register. | Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
| 1999 | VTS | Modular TSC Checkers for Bose-Lin and Bose Codes. | Xrysovalantis Kavousianos, Dimitris Nikolos |
| 1998 | VTS | Novel Single and Double Output TSC Berger Code Checkers. | Xrysovalantis Kavousianos, Dimitris Nikolos |
| 1997 | VTS | Self-exercising self testing k-order comparators. | Xrysovalantis Kavousianos, Dimitris Nikolos |