Smart-Inspect: Micro Scale Localization and Classification of Smartphone Glass Defects for Industrial Automation.
M. Usman Maqbool Bhutta, Shoaib Aslam, Peng Yun, Jianhao Jiao, Ming Liu
Browse the full IROS paper archive.
M. Usman Maqbool Bhutta, Shoaib Aslam, Peng Yun, Jianhao Jiao, Ming Liu
Browse the full IROS paper archive.