An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited.
Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal
Browse the full ITC paper archive.
Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal
Browse the full ITC paper archive.