Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor.

Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes

Browse the full ITC paper archive.