| 2025 | ICCV | Guardians of Generation: Dynamic Inference-Time Copyright Shielding with Adaptive Guidance for AI Image Generation. | Soham Roy, Abhishek Mishra, Aakash Sen Sharma, Shirish S. Karande, Murari Mandal |
| 2024 | ITC | Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor. | Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes |
| 2024 | ITC | Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults. | Soham Roy, Vishwani D. Agrawal |
| 2024 | VLSID | An Amalgamated Testability Measure Derived from Machine Intelligence. | Soham Roy, Vishwani D. Agrawal |
| 2021 | ETS | Unsupervised Learning in Test Generation for Digital Integrated Circuits. | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
| 2021 | VLSID | Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
| 2021 | VTS | Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
| 2020 | ITC | Machine Intelligence for Efficient Test Pattern Generation. | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |