Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
On-chip Test and Repair of Memories for Static and Dynamic Faults.
Sanjay K. Thakur
,
Rubin A. Parekhji
,
Arun N. Chandorkar
Venue
A
ITC
Year
2006
Proceedings
ITC
DBLP record
conf/itc/ThakurPC06 ↗
Browse the full
ITC paper archive
.