STAR-ATPG: a high speed test pattern generator for large scan designs.
Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska
Browse the full ITC paper archive.
Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska
Browse the full ITC paper archive.