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Paper
Impact of Device Aging on Early Mode Failures in Pulsed Latches.
Ankur Shukla
,
Rahul M. Rao
,
James D. Warnock
Venue
National
VLSID
Year
2018
Proceedings
VLSID
DBLP record
conf/vlsid/ShuklaRW18 ↗
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