Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization.
Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur
Browse the full VLSID paper archive.
Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur
Browse the full VLSID paper archive.