| 2011 | ETS | AVF Analysis Acceleration via Hierarchical Fault Pruning. | Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris |
| 2009 | ICCD | Impact analysis of performance faults in modern microprocessors. | Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris |
| 2009 | VTS | RT-Level Deviation-Based Grading of Functional Test Sequences. | Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti |
| 2009 | VTS | Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. | Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris |
| 2008 | ASPDAC | Pessimism reduction in coupling-aware static timing analysis using timing and logic filtering. | Debasish Das, Kip Killpack, Chandramouli V. Kashyap, Abhijit Jas, Hai Zhou |
| 2008 | DATE | A low-cost concurrent error detection technique for processor control logic. | Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srinivas Patil, Rajesh Galivanche |
| 2008 | ETS | Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. | Cecilia Metra, Daniele Rossi, Martin Omaa, Abhijit Jas, Rajesh Galivanche |
| 2008 | ITC | On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. | Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris |
| 2001 | ITC | Test vector encoding using partial LFSR reseeding. | C. V. Krishna, Abhijit Jas, Nur A. Touba |
| 2001 | VTS | Hybrid BIST Based on Weighted Pseudo-Random Testing: A New Test Resource Partitioning Scheme. | Abhijit Jas, C. V. Krishna, Nur A. Touba |
| 2000 | VTS | Virtual Scan Chains: A Means for Reducing Scan Length in Cores. | Abhijit Jas, Bahram Pouya, Nur A. Touba |
| 1999 | ICCD | Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip. | Abhijit Jas, Nur A. Touba |
| 1999 | ISCAS | Configuration self-test in FPGA-based reconfigurable systems. | W. Quddus, Abhijit Jas, Nur A. Touba |
| 1999 | VTS | Scan Vector Compression/Decompression Using Statistical Coding. | Abhijit Jas, Jayabrata Ghosh-Dastidar, Nur A. Touba |
| 1998 | ITC | Test vector decompression via cyclical scan chains and its application to testing core-based designs. | Abhijit Jas, Nur A. Touba |