Alexandre Ney
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
4
Active years
2007–2009
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | DATE | A new design-for-test technique for SRAM core-cell stability faults. | Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
| 2008 | DATE | A Design-for-Diagnosis Technique for SRAM Write Drivers. | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
| 2008 | ITC | A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. | Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2008 | VTS | An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
| 2007 | DATE | Slow write driver faults in 65nm SRAM technology: analysis and March test solution. | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2007 | ETS | Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2007 | VTS | Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |