A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs.
Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Browse the full ITC paper archive.
Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Browse the full ITC paper archive.