Alberto Bosio
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
123
Venues
12
Active years
2005–2026
Best venue rank
A*
Where they publish
Papers
123 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | DATE | Multi-Partner Project: Scalable, Ferroelectric-based Accelerators for Energy Efficient Edge AI (Ferro4EdgeAI). | Theofilos Spyrou, Yashvardhan Biyani, Konstantinos Stavrakakis, Rajendra Bishnoi, Said Hamdioui, Joel Minguet Lopez, Louise Dumas, Jean Coignus, Denys Ly, Hugo Chazot-Ranquet, Laurent Grenouillet, Fabien Grimaud, Simon Martin, Olivier Billoint, Franois Andrieu, Ruben Alcala, Stefan Slesazeck, Athira Sunil, Chong Peng, Antoine Cauquil, Rosario Pronsat, Damien Deleruyelle, Cdric Marchand, Alberto Bosio, Ian O'Connor, Giulio Urlini, Simon Jeannot, Mohammad Sajedi Alvar, Nima Akbari Moghaddam, Thilo Werner, Tony Schenk, Bojun Cheng, Mina Khoei, Luca Prez Ramrez, EunJin Koh, Somnath Kale, Nicholas Barrett |
| 2026 | DDECS | Comparative Analysis of Hardware Accelerator Architectures for Performance and Energy Efficient Deep Neural Network Execution. | Salsabil Saoudi, Mario Barbareschi, Alberto Bosio |
| 2026 | ETS | Test Sample Ranking for Fault Detection in Decision Tree-based Inference Model. | Antonio Emmanuele, Mario Barbareschi, Alberto Bosio |
| 2026 | ETS | A Holistic Framework to Assess Reliability Issues in Emerging Technologies due to Ageing, Voltage and Temperature Variation. | Sara Mannaa, Grgory Loubet, Salvatore Pappalardo, Cdric Marchand, Damien Deleruyelle, Alberto Bosio, Christoph Lenz, Oskar Baumgartner, Yifan Wang, Franois Marc, Chhandak Mukherjee, Marina Deng, Cristell Maneux, Ian O'Connor |
| 2026 | IOLTS | Hybrid Hardening for Robust DNNs Under Adversarial Attacks. | Leonardo Alexandrino De Melo, Manar Gani, Alberto Bosio, Ovidiu Stan, Vlad-Cristian Miclea, Liviu Miclea, Rodrigo Possamai Bastos, David Novo, Bastien Deveautour |
| 2026 | VTS | VTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award. | Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu |
| 2026 | VTS | Special Session: Reliability Assessment of DNN Models and Inference on Systolic Arrays. | Natalia Cherezova, Salvatore Pappalardo, Annachiara Ruospo, Bastien Deveautour, Lorenzo Fezza, Artur Jutman, Ernesto Snchez, Alberto Bosio, Matteo Sonza Reorda, Maksim Jenihhin |
| 2025 | DDECS | Automatic generation of input-aware approximate arithmetic circuits. | Mario Barbareschi, Salvatore Barone, Alberto Bosio, Bastien Deveautour, Ali Piri, Marcello Traiola |
| 2025 | DDECS | DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks. | Nicol Bellarmino, Alberto Bosio, Riccardo Cantoro, Annachiara Ruospo, Ernesto Snchez |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ITC | A Benchmark Suite to Evaluate DNN's Resilience. | Cristiana Bolchini, Alberto Bosio, Luca Cassano, Antonio Miele, Salvatore Pappalardo, Dario Passariello, Annachiara Ruospo, Ernesto Snchez, Matteo Sonza Reorda, Vittorio Turco |
| 2025 | VTS | Special Session: Trustworthy Hardware-AI at the Cloud. | Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Snchez, Arani Sinha, Vittorio Turco |
| 2025 | VTS | MicroFI: TensorFlow Lite based Fault Injection Framework for Microcontrollers. | Leonardo Alexandrino De Melo, Rodrigo Possamai Bastos, Alberto Bosio |
| 2024 | DATE | Resilience of Deep Learning Applications: Where We are and Where We Want to Go. | Cristiana Bolchini, Alberto Bosio |
| 2024 | DATE | FVLLMONTI: The 3D Neural Network Compute Cube $(N^{2}C^{2})$ Concept for Efficient Transformer Architectures Towards Speech-to-Speech Translation. | Ian O'Connor, Sara Mannaa, Alberto Bosio, Bastien Deveautour, Damien Deleruyelle, Tetiana Obukhova, Cdric Marchand, Jens Trommer, igdem akirlar, Bruno Neckel Wesling, Thomas Mikolajick, Oskar Baumgartner, Mischa Thesberg, David Pirker, Christoph Lenz, Zlatan Stanojevic, Markus Karner, Guilhem Larrieu, Sylvain Pelloquin, Konstantinous Moustakas, Jonas Mller, Giovanni Ansaloni, Alireza Amirshahi, David Atienza, Jean-Luc Rouas, Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier, Chhandak Mukherjee, Marina Deng, Yifan Wang, Marc Franois, Houssem Rezgui, Reveil Lucas, Cristell Maneux |
| 2024 | DATE | High-Performance Data Mapping for BNNs on PCM-Based Integrated Photonics. | Taha Shahroodi, Raphael Cardoso, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui |
| 2024 | DDECS | SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators. | Mahdi Taheri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin, Salvatore Pappalardo, Paul Jimnez, Bastien Deveautour, Alberto Bosio |
| 2024 | ETS | Approximate Fault-Tolerant Neural Network Systems. | Marcello Traiola, Salvatore Pappalardo, Ali Piri, Annachiara Ruospo, Bastien Deveautour, Ernesto Snchez, Alberto Bosio, Sepide Saeedi, Alessio Carpegna, Anil Bayram Gogebakan, Enrico Magliano, Alessandro Savino |
| 2024 | IOLTS | Hardware Accelerator for FIPS 202 Hash Functions in Post-Quantum Ready SoCs. | Diamante Simone Crescenzo, Rafael Carrera Rodriguez, Riccardo Alidori, Florent Bruguier, Emanuele Valea, Pascal Benoit, Alberto Bosio |
| 2024 | PRDC | Robustness of Redundancy-Hardened Convolutional Neural Networks Against Adversarial Attacks. | Leonardo Alexandrino De Melo, Mauricio Gomes de Queiroz, Alberto Bosio, Rodrigo Possamai Bastos |
| 2024 | VTS | Special Session: Reliability Assessment Recipes for DNN Accelerators. | Mohammad Hasan Ahmadilivani, Alberto Bosio, Bastien Deveautour, Fernando Fernandes dos Santos, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Salvatore Pappalardo, Jaan Raik, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Mahdi Taheri, Marcello Traiola |
| 2023 | DATE | Exploiting assertions mining and fault analysis to guide RTL-level approximation. | Alberto Bosio, Samuele Germiniani, Graziano Pravadelli, Marcello Traiola |
| 2023 | DATE | Lightspeed Binary Neural Networks using Optical Phase-Change Materials. | Taha Shahroodi, Raphael Cardoso, Mahdi Zahedi, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui |
| 2023 | DDECS | Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator. | Salvatore Pappalardo, Annachiara Ruospo, Ian O'Connor, Bastien Deveautour, Ernesto Snchez, Alberto Bosio |
| 2023 | DSN | Input-aware accuracy characterization for approximate circuits. | Ali Piri, Salvatore Pappalardo, Salvatore Barone, Mario Barbareschi, Bastien Deveautour, Marcello Traiola, Ian O'Connor, Alberto Bosio |
| 2023 | VTS | Special Session: Approximation and Fault Resiliency of DNN Accelerators. | Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Snchez, Mahdi Taheri |
| 2023 | VTS | Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies. | Fabio Pavanello, Elena-Ioana Vatajelu, Alberto Bosio, Thomas Van Vaerenbergh, Peter Bienstman, Benot Charbonnier, Alessio Carpegna, Stefano Di Carlo, Alessandro Savino |
| 2022 | ASPDAC | A Heuristic Exploration of Retraining-free Weight-Sharing for CNN Compression. | Etienne Dupuis, David Novo, Ian O'Connor, Alberto Bosio |
| 2022 | DDECS | A Design Space Exploration Framework for Memristor-Based Crossbar Architecture. | Mario Barbareschi, Alberto Bosio, Ian O'Connor, Petr Fiser, Marcello Traiola |
| 2022 | DDECS | Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope? | Cristiana Bolchini, Alberto Bosio, Luca Cassano, Bastien Deveautour, Giorgio Di Natale, Antonio Miele, Ian O'Connor, Elena-Ioana Vatajelu |
| 2022 | DDECS | Selective Hardening of Critical Neurons in Deep Neural Networks. | Annachiara Ruospo, Gabriele Gavarini, Ilaria Bragaglia, Marcello Traiola, Alberto Bosio, Ernesto Snchez |
| 2022 | DSN | Reliability assessment of FreeRTOS in Embedded Systems. | Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino |
| 2021 | DDECS | Emerging Technologies: Challenges and Opportunities for Logic Synthesis. | Alberto Bosio, Mayeul Cantan, Cdric Marchand, Ian O'Connor, Petr Fiser, Arnaud Poittevin, Marcello Traiola |
| 2021 | DDECS | A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. | Lucas Matana Luza, Annachiara Ruospo, Alberto Bosio, Ernesto Snchez, Luigi Dilillo |
| 2021 | DDECS | Efficient Neural Network Approximation via Bayesian Reasoning. | Alessandro Savino, Marcello Traiola, Stefano Di Carlo, Alberto Bosio |
| 2021 | DDECS | AdequateDL: Approximating Deep Learning Accelerators. | Olivier Sentieys, Silviu-Ioan Filip, David Briand, David Novo, Etienne Dupuis, Ian O'Connor, Alberto Bosio |
| 2021 | DDECS | Tutorial: Silicon Systems for Wireless LAN. | Zoran Stamenkovic, Hassen Aziza, Ernesto Snchez, Alberto Bosio |
| 2021 | ETS | Emerging Computing Devices: Challenges and Opportunities for Test and Reliability | Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jrgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels |
| 2021 | ICCAD | Design Space Exploration of Approximation-Based Quadruple Modular Redundancy Circuits. | Marcello Traiola, Jorge Echavarria, Alberto Bosio, Jrgen Teich, Ian O'Connor |
| 2021 | VTS | Special Session: Operating Systems under test: an overview of the significance of the operating system in the resiliency of the computing continuum. | Emmanuel Casseau, Petr Dobis, Oliver Sinnen, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Alessandro Savino, Stefano Di Carlo, Maurizio Rebaudengo, Alberto Bosio |
| 2020 | DATE | On the Automatic Exploration of Weight Sharing for Deep Neural Network Compression. | Etienne Dupuis, David Novo, Ian O'Connor, Alberto Bosio |
| 2020 | DATE | Maximizing Yield for Approximate Integrated Circuits. | Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio |
| 2020 | DDECS | Sensitivity Analysis and Compression Opportunities in DNNs Using Weight Sharing. | Etienne Dupuis, David Novo, Ian O'Connor, Alberto Bosio |
| 2020 | DSD | Evaluating Convolutional Neural Networks Reliability depending on their Data Representation. | Annachiara Ruospo, Alberto Bosio, Alessandro Ianne, Ernesto Snchez |
| 2020 | DSN | Cross-Layer Soft-Error Resilience Analysis of Computing Systems. | Alberto Bosio, Ramon Canal, Stefano Di Carlo, Dimitris Gizopoulos, Alessandro Savino |
| 2020 | ETS | Design, Verification, Test and In-Field Implications of Approximate Computing Systems. | Alberto Bosio, Stefano Di Carlo, Patrick Girard, Ernesto Snchez, Alessandro Savino, Luks Sekanina, Marcello Traiola, Zdenek Vascek, Arnaud Virazel |
| 2020 | ETS | Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. | Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
| 2020 | ITC | A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns. | Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
| 2019 | ETS | Alternatives to Fault Injections for Early Safety/Security Evaluations. | Michele Portolan, Alessandro Savino, Rgis Leveugle, Stefano Di Carlo, Alberto Bosio, Giorgio Di Natale |
| 2019 | IOLTS | Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. | Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar |
| 2019 | ITC | International Symposium on Design and Diagnostics of Electronic Circuits and Systems. | Zoran Stamenkovic, Alberto Bosio, Gyrgy Cserey, Ondrej Novk, Witold A. Pleskacz, Luks Sekanina, Andreas Steininger, Goran Stojanovic, Viera Stopjakov |
| 2018 | DDECS | Synthesis of Finite State Machines on Memristor Crossbars. | Umberto Ferrandino, Marcello Traiola, Mario Barbareschi, Antonino Mazzeo, Petr Fiser, Alberto Bosio |
| 2018 | DDECS | On the Comparison of Different ATPG Approaches for Approximate Integrated Circuits. | Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio |
| 2018 | IOLTS | Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications. | Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio |
| 2018 | IOLTS | Predicting the Impact of Functional Approximation: from Component- to Application-Level. | Marcello Traiola, Alessandro Savino, Mario Barbareschi, Stefano Di Carlo, Alberto Bosio |
| 2018 | ITC | An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. | Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard |
| 2018 | VTS | Special session: How approximate computing impacts verification, test and reliability. | Luks Sekanina, Zdenek Vascek, Alberto Bosio, Marcello Traiola, Paolo Rech, Daniel Oliveira, Fernando Fernandes, Stefano Di Carlo |
| 2017 | DDECS | Formal Design Space Exploration for memristor-based crossbar architecture. | Marcello Traiola, Mario Barbareschi, Alberto Bosio |
| 2017 | DDECS | Towards approximation during test of Integrated Circuits. | Imran Wali, Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio |
| 2017 | IOLTS | Reliability of computing systems: From flip flops to variables. | Giorgio Di Natale, Maha Kooli, Alberto Bosio, Michele Portolan, Rgis Leveugle |
| 2016 | DDECS | System-level reliability evaluation through cache-aware software-based fault injection. | Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2016 | DDECS | A hybrid power modeling approach to enhance high-level power models. | Alejandro Nocua, Arnaud Virazel, Alberto Bosio, Patrick Girard, Cyril Chevalier |
| 2016 | DDECS | An effective approach for functional test programs compaction. | Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda |
| 2016 | ETS | A low-cost susceptibility analysis methodology to selectively harden logic circuits. | Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda |
| 2016 | IOLTS | Cache-aware reliability evaluation through LLVM-based analysis and fault injection. | Maha Kooli, Giorgio Di Natale, Alberto Bosio |
| 2016 | ITC | Cross-layer system reliability assessment framework for hardware faults. | Alessandro Vallero, Alessandro Savino, Gianfranco Politano, Stefano Di Carlo, Athanasios Chatzidimitriou, Sotiris Tselonis, Manolis Kaliorakis, Dimitris Gizopoulos, Marc Riera, Ramon Canal, Antonio Gonzlez, Maha Kooli, Alberto Bosio, Giorgio Di Natale |
| 2016 | VTS | Thermal issues in test: An overview of the significant aspects and industrial practice. | Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser |
| 2016 | VTS | Cache- and register-aware system reliability evaluation based on data lifetime analysis. | Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio |
| 2015 | DATE | Exploring the impact of functional test programs re-used for power-aware testing. | Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda |
| 2015 | DDECS | Design-for-Diagnosis Architecture for Power Switches. | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, P. Debaud, S. Guilhot |
| 2015 | ETS | An effective hybrid fault-tolerant architecture for pipelined cores. | Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard |
| 2015 | IOLTS | Design space exploration and optimization of a Hybrid Fault-Tolerant Architecture. | Imran Wali, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda |
| 2014 | ASPDAC | Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration. | Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2014 | DDECS | Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce. | Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| 2014 | DDECS | An intra-cell defect grading tool. | Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi |
| 2014 | DDECS | Timing-aware ATPG for critical paths with multiple TSVs. | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2014 | DDECS | Test and diagnosis of power switches. | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot |
| 2014 | DDECS | Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. | Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri |
| 2014 | ETS | A novel adaptive fault tolerant flip-flop architecture based on TMR. | Luca Cassano, Alberto Bosio, Giorgio Di Natale |
| 2014 | ETS | iBoX - Jitter based Power Supply Noise sensor. | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot |
| 2014 | VTS | TSV aware timing analysis and diagnosis in paths with multiple TSVs. | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2013 | DATE | Test solution for data retention faults in low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | ETS | Computing detection probability of delay defects in signal line tsvs. | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Pascal Vivet, Marc Belleville |
| 2013 | ETS | Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. | Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | IOLTS | SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. | Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frdric Saign |
| 2013 | ITC | On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | VTS | A built-in scheme for testing and repairing voltage regulators of low-power srams. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | DATE | Impact of resistive-open defects on the heat current of TAS-MRAM architectures. | Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Guillaume Prenat, Jrmy Alvarez-Herault, Ken Mackay |
| 2012 | ETS | Coupling-based resistive-open defects in TAS-MRAM architectures. | Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jrmy Alvarez-Herault, Ken Mackay |
| 2012 | ETS | Through-Silicon-Via resistive-open defect analysis. | Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2012 | ETS | Defect analysis in power mode control logic of low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | IOLTS | Evaluation of test algorithms stress effect on SRAMs under neutron radiation. | Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frdric Saign |
| 2012 | ITC | Low-power SRAMs power mode control logic: Failure analysis and test solutions. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | VTS | Advanced test methods for SRAMs. | Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| 2012 | VTS | A pseudo-dynamic comparator for error detection in fault tolerant architectures. | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2011 | DDECS | On using a SPICE-like TSTAC™ eFlash model for design and test. | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benot Godard, Gilles Festes, Laurent Vachez |
| 2011 | DDECS | A study of path delay variations in the presence of uncorrelated power and ground supply noise. | Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel |
| 2011 | DDECS | Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2011 | ETS | A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Snchez, Mauricio de Carvalho, Matteo Sonza Reorda |
| 2011 | ITC | On using address scrambling to implement defect tolerance in SRAMs. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | DAC | A statistical simulation method for reliability analysis of SRAM core-cells. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | DDECS | Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. | Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen |
| 2010 | ETS | Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | ETS | Setting test conditions for improving SRAM reliability. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | ETS | A two-layer SPICE model of the ATMEL TSTAC | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benot Godard, Gilles Festes, Laurent Vachez |
| 2010 | ITC | Parity prediction synthesis for nano-electronic gate designs. | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich |
| 2010 | ITC | Is test power reduction through X-filling good enough? | Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed |
| 2010 | VTS | Detecting NBTI induced failures in SRAM core-cells. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2009 | DDECS | Comprehensive bridging fault diagnosis based on the SLAT paradigm. | Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute |
| 2009 | DDECS | An efficient fault simulation technique for transition faults in non-scan sequential circuits. | Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda |
| 2009 | ITC | NAND flash testing: A preliminary study on actual defects. | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benot Godard |
| 2008 | DDECS | SoC Symbolic Simulation: a case study on delay fault testing. | Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi |
| 2008 | IOLTS | A Modular Memory BIST for Optimized Memory Repair. | Philipp hler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand |
| 2008 | IOLTS | Yield Improvement, Fault-Tolerance to the Rescue?. | Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2008 | ITC | A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. | Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2008 | ITC | SoC Yield Improvement: Redundant Architectures to the Rescue? | Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | DDECS | A Mixed Approach for Unified Logic Diagnosis. | Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | ETS | DERRIC: A Tool for Unified Logic Diagnosis. | Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2006 | DATE | Automatic march tests generations for static linked faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2006 | DDECS | A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2006 | ETS | A 22n March Test for Realistic Static Linked Faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2005 | ETS | Automatic March tests generation for static and dynamic faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2005 | ITC | March AB, March AB1: new March tests for unlinked dynamic memory faults. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |