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Magali Bastian

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

9

Venues

6

Active years

2005–2009

Best venue rank

A*

Where they publish

Papers

9 indexed papers, newest first.

YearVenueTitleAuthors
2009DATEA new design-for-test technique for SRAM core-cell stability faults.Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2008DATEA Design-for-Diagnosis Technique for SRAM Write Drivers.Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2008ITCA History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs.Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2008VTSAn SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
2007DATESlow write driver faults in 65nm SRAM technology: analysis and March test solution.Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2007ETSDynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2007VTSUn-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2006DDECSMarch Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
2005DACResistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 m and 90 nm technologies.Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian