cs-conference-ranking.org Search 971 venues

Ali Keshavarzi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

17

Venues

7

Active years

1997–2005

Best venue rank

A*

Where they publish

Papers

17 indexed papers, newest first.

Year	Venue	Title	Authors
2005	DATE	A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.	Jos Luis Rossell, Vicent Canals, Sebasti A. Bota, Ali Keshavarzi, Jaume Segura
2005	ISCAS	Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power.	James W. Tschanz, Siva G. Narendra, Ali Keshavarzi, Vivek De
2005	ISLPED	Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.	Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De
2005	VLSID	Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF.	Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay
2004	DAC	Design optimizations for microprocessors at low temperature.	Arman Vassighi, Ali Keshavarzi, Siva G. Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De
2004	ITC	Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.	Sebasti A. Bota, M. Rosales, Jos Luis Rossell, Jaume Segura, Ali Keshavarzi
2004	ITC	A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs.	Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
2003	DAC	Parameter variations and impact on circuits and microarchitecture.	Shekhar Borkar, Tanay Karnik, Siva G. Narendra, James W. Tschanz, Ali Keshavarzi, Vivek De
2003	ITC	CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.	Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura
2003	ITC	Burn-in Temperature Projections for Deep Sub-micron Technologies.	Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
2002	ITC	A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits.	Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
2002	ITC	Parametric Failures in CMOS ICs - A Defect-Based Analysis.	Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
2002	VTS	Challenges in Nanometric Technology Scaling: Trends and Projections.	Jaume Segura, Vivek De, Ali Keshavarzi
2001	ISLPED	Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs.	Ali Keshavarzi, Sean Ma, Siva G. Narendra, Brad Bloechel, K. Mistry, Tahir Ghani, Shekhar Borkar, Vivek De
2000	ITC	Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.	Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De
1999	ISLPED	Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's.	Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De
1997	ITC	Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs.	Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins